3 edition of Close-range photogrammetric measurement of static defections for an aeroelastic supercritical wing found in the catalog.
Close-range photogrammetric measurement of static defections for an aeroelastic supercritical wing
Published
1990 by National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division, National Technical Information Service, distributor] in [Washington, DC], [Springfield, Va .
Written in English
Edition Notes
| Other titles | Close range photogrammetric measurement of static defections for an aeroelastic supercritical wing. |
| Statement | Thomas A. Byrdsong, Richard R. Adams, and Maynard C. Sandford. |
| Series | NASA technical memorandum -- 4194. |
| Contributions | Adams, Richard R., Sandford, M. C., United States. National Aeronautics and Space Administration. Scientific and Technical Information Division. |
| The Physical Object | |
|---|---|
| Format | Microform |
| Pagination | 1 v. |
| ID Numbers | |
| Open Library | OL15405511M |
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